{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T13:29:20Z","timestamp":1764250160848,"version":"3.37.3"},"reference-count":82,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2018,4,1]],"date-time":"2018-04-01T00:00:00Z","timestamp":1522540800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2018,4]]},"DOI":"10.1109\/mdat.2017.2766170","type":"journal-article","created":{"date-parts":[[2017,10,24]],"date-time":"2017-10-24T18:12:20Z","timestamp":1508868740000},"page":"73-90","source":"Crossref","is-referenced-by-count":36,"title":["Protection Against Hardware Trojans With Logic Testing: Proposed Solutions and Challenges Ahead"],"prefix":"10.1109","volume":"35","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4876-2982","authenticated-orcid":false,"given":"Sophie","family":"Dupuis","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7231-3976","authenticated-orcid":false,"given":"Marie-Lise","family":"Flottes","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8063-5388","authenticated-orcid":false,"given":"Giorgio","family":"Di Natale","sequence":"additional","affiliation":[]},{"given":"Bruno","family":"Rouzeyre","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53140-2_7"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2511144"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140252"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228377"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894311"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2013.11.002"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495588"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581564"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/CADS.2013.6714240"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.89"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2016.10"},{"key":"ref79","first-page":"56","article-title":"TrustedRTL: Trojan detection methodology in pre-silicon designs","author":"banga","year":"2010","journal-title":"Proc IEEE Int Symp Hardware-Oriented Security Trust"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2028166"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DASC.2013.50"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2009.22"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1366110.1366196"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516656"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.90"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140242"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5255-2"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/DEPCOS-RELCOMEX.2006.50"},{"key":"ref62","first-page":"705","article-title":"Applications of testability analysis: From ATPG to critical delay path tracing","author":"brglez","year":"1984","journal-title":"Proc Int Test Conf"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.261"},{"key":"ref63","doi-asserted-by":"crossref","first-page":"471","DOI":"10.7873\/DATE.2015.0365","article-title":"Hardware Trojan detection for gate-level ICs using signal correlation based clustering","author":"cakir","year":"2015","journal-title":"Proc Des Autom Test Europe"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.15"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5954999"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2016.7482481"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544389"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1981.1084930"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1080\/19393555.2014.891277"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2016.02.010"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403631"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176634"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484928"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2016.7566609"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.1102"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-48324-4_29"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_28"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2015.7381800"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2015.7059101"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.protcy.2014.10.197"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2012.134"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"ref58","first-page":"1","article-title":"Duplication-based concurrent detection of hardware Trojans in integrated circuits","author":"palanichamy","year":"2016","journal-title":"Proc Trustworthy Manuf Utilization Secure Devices Workshop"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2010.26"},{"key":"ref56","first-page":"1","article-title":"Integrated circuit security—New threats and solutions","author":"abramovici","year":"2009","journal-title":"Proc Workshop on Cyber Security and Inform Intelligence Res"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/652187"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2424929"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873671"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559048"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332154"},{"key":"ref11","first-page":"15","article-title":"Detecting malicious inclusion in secure hardware: Challenges and solutions","author":"wang","year":"2008","journal-title":"Proc IEEE Int Workshop Hardware-Oriented Security Trust"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2356453"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2010.299"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2488495"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2007.36"},{"key":"ref15","first-page":"51","article-title":"Hardware Trojan detection using path delay fingerprint","author":"jin","year":"2008","journal-title":"Proc IEEE Int Workshop Hardware-Oriented Security Trust"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2014.0039"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140254"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231062"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.1103"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630091"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS.2014.7032768"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5954998"},{"journal-title":"A survey of hardware Trojan threat and defense","year":"2016","author":"li","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2334493"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2009.5340158"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2906147"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCES.2015.7393075"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2010.369"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2460551"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.1101"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2093547"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2009.5224968"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/2656075.2656077"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2014.7045840"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140229"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.22"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2009.5224960"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2015.7396749"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/8323437\/08081752.pdf?arnumber=8081752","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:21:49Z","timestamp":1642004509000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8081752\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,4]]},"references-count":82,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2017.2766170","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2018,4]]}}}