{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,5]],"date-time":"2024-07-05T21:19:22Z","timestamp":1720214362320},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/mdat.2018.2863703","type":"journal-article","created":{"date-parts":[[2018,8,6]],"date-time":"2018-08-06T18:16:08Z","timestamp":1533579368000},"page":"78-85","source":"Crossref","is-referenced-by-count":2,"title":["GPU-Accelerated Soft Error Rate Analysis of Large-Scale Integrated Circuits"],"prefix":"10.1109","volume":"35","author":[{"given":"M. Amin","family":"Sabet","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Behnam","family":"Ghavami","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohsen","family":"Raji","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"4","article-title":"SEAT-LA: A soft error analysis tool for combinational logic","author":"rajaramant","year":"2006","journal-title":"Proc 19th Int Conf VLSI Design Held Jointly With 5th Int Conf Embedded Syst Design"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.64"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1989.36234"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2897976"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891036"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862738"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860679"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0944-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2161700"},{"key":"ref2","first-page":"1","article-title":"Measurement and reporting of alpha particles and terrestrial cosmic ray-induced soft errors in semiconductor devices: JESD89A","year":"2006","journal-title":"JEDEC STANDARD JEDEC Solid State Technology Association"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2598560"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784522"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/8554309\/08426019.pdf?arnumber=8426019","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T02:05:39Z","timestamp":1643249139000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8426019\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":12,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2018.2863703","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,12]]}}}