{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,5]],"date-time":"2022-04-05T19:49:40Z","timestamp":1649188180976},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/mdat.2018.2873454","type":"journal-article","created":{"date-parts":[[2018,11,30]],"date-time":"2018-11-30T19:32:11Z","timestamp":1543606331000},"page":"94-95","source":"Crossref","is-referenced-by-count":0,"title":["Report on the 2018 IEEE\/ACM International Symposium on Low Power Electronics and Design"],"prefix":"10.1109","volume":"35","author":[{"given":"Jaydeep","family":"Kulkarni","sequence":"first","affiliation":[]},{"given":"Thomas F.","family":"Wenisch","sequence":"additional","affiliation":[]}],"member":"263","container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/8554309\/08554351.pdf?arnumber=8554351","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:35:13Z","timestamp":1642005313000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8554351\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":0,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2018.2873454","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,12]]}}}