{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T19:04:53Z","timestamp":1769540693692,"version":"3.49.0"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/mdat.2019.2941713","type":"journal-article","created":{"date-parts":[[2019,9,16]],"date-time":"2019-09-16T15:32:31Z","timestamp":1568647951000},"page":"82-83","source":"Crossref","is-referenced-by-count":0,"title":["Conference Report from the 2019 International Symposium on Low Power Electronics and Design (ISLPED)"],"prefix":"10.1109","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7270-5558","authenticated-orcid":false,"given":"Andreas","family":"Burg","sequence":"first","affiliation":[{"name":"Ecole Polytechnique Federal de Lausanne EPFL-STI-IEL-TCL, Lausanne, Switzerland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9259-7304","authenticated-orcid":false,"given":"Mathew","family":"Ziegler","sequence":"additional","affiliation":[{"name":"IBM"}]},{"given":"Saibal","family":"Mukhopdhyay","sequence":"additional","affiliation":[{"name":"Georgia Tech"}]}],"member":"263","container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/8890011\/08839860.pdf?arnumber=8839860","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T05:57:40Z","timestamp":1769493460000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8839860\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":0,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2019.2941713","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,12]]}}}