{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T15:55:26Z","timestamp":1774022126042,"version":"3.50.1"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/mdat.2019.2947282","type":"journal-article","created":{"date-parts":[[2019,10,14]],"date-time":"2019-10-14T19:20:34Z","timestamp":1571080834000},"page":"84-92","source":"Crossref","is-referenced-by-count":13,"title":["Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices"],"prefix":"10.1109","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1959-2013","authenticated-orcid":false,"given":"Benoit W.","family":"Denkinger","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9662-498X","authenticated-orcid":false,"given":"Flavio","family":"Ponzina","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5912-6324","authenticated-orcid":false,"given":"Soumya S.","family":"Basu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0135-5095","authenticated-orcid":false,"given":"Andrea","family":"Bonetti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8889-0201","authenticated-orcid":false,"given":"Szabolcs","family":"Balasi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martino","family":"Ruggiero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5760-090X","authenticated-orcid":false,"given":"Miguel","family":"Peon-Quiros","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0651-5393","authenticated-orcid":false,"given":"Davide","family":"Rossi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7270-5558","authenticated-orcid":false,"given":"Andreas","family":"Burg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9536-4947","authenticated-orcid":false,"given":"David","family":"Atienza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2857019"},{"key":"ref3","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"NIPS"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627629"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001165"},{"key":"ref11","article-title":"BinaryConnect: Training deep neural networks with binary weights during propagations","author":"courbariaux","year":"2015","journal-title":"CoRR"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2017.8335699"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3195997"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS.2019.8771544"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317830"},{"key":"ref9","first-page":"1","article-title":"Resolving the memory bottleneck for single supply near-threshold computing","author":"gemmeke","year":"2014","journal-title":"DATE"},{"key":"ref1","author":"goodfellow","year":"2016","journal-title":"Deep Learning"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/9075303\/08868100.pdf?arnumber=8868100","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T17:21:40Z","timestamp":1651080100000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8868100\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":11,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2019.2947282","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,4]]}}}