{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:35:31Z","timestamp":1740170131866,"version":"3.37.3"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2020,10]]},"DOI":"10.1109\/mdat.2020.2986742","type":"journal-article","created":{"date-parts":[[2020,4,9]],"date-time":"2020-04-09T19:58:17Z","timestamp":1586462297000},"page":"75-84","source":"Crossref","is-referenced-by-count":2,"title":["Vulnerability of Hardware Neural Networks to Dynamic Operation Point Variations"],"prefix":"10.1109","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8254-5298","authenticated-orcid":false,"given":"Jeng-Hau","family":"Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4476-2501","authenticated-orcid":false,"given":"Xun","family":"Jiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mulong","family":"Luo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1900-2124","authenticated-orcid":false,"given":"Zhuowen","family":"Tu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajesh K.","family":"Gupta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927168"},{"key":"ref3","first-page":"4107","article-title":"Binarized neural networks","author":"hubara","year":"2016","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1993316.1993518"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714951"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2682885"},{"key":"ref5","first-page":"825","article-title":"Local binary pattern networks","author":"lin","year":"2020","journal-title":"Proc IEEE Winter Conf Appl Comput Vis (WACV)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0618"},{"journal-title":"tiny-dnn","year":"2016","author":"nomi","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967021"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2419628"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/0031-3203(95)00067-4"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.44"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/9216640\/09062561.pdf?arnumber=9062561","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T17:21:32Z","timestamp":1651080092000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9062561\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10]]},"references-count":12,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2020.2986742","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2020,10]]}}}