{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T20:21:15Z","timestamp":1771705275221,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000185","name":"Defense Advanced Research Projects Agency","doi-asserted-by":"publisher","award":["HR001118C0096"],"award-info":[{"award-number":["HR001118C0096"]}],"id":[{"id":"10.13039\/100000185","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/mdat.2020.2988657","type":"journal-article","created":{"date-parts":[[2020,4,21]],"date-time":"2020-04-21T00:07:31Z","timestamp":1587427651000},"page":"92-100","source":"Crossref","is-referenced-by-count":8,"title":["Advances in Design and Test of Monolithic 3-D ICs"],"prefix":"10.1109","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9353-6397","authenticated-orcid":false,"given":"Arjun","family":"Chaudhuri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1136-9220","authenticated-orcid":false,"given":"Sanmitra","family":"Banerjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Heechun","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4380-6656","authenticated-orcid":false,"given":"Jinwoo","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0146-4977","authenticated-orcid":false,"given":"Gauthaman","family":"Murali","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5708-2866","authenticated-orcid":false,"given":"Edward","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5582-3579","authenticated-orcid":false,"given":"Daehyun","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sung Kyu","family":"Lim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Saibal","family":"Mukhopadhyay","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4475-6435","authenticated-orcid":false,"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"175","article-title":"A linear-time heuristic for improving network partitions","author":"fiduccia","year":"1982","journal-title":"Proc DAC"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967080"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.945309"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICMEL.2004.1314941"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116296"},{"key":"ref15","first-page":"1","article-title":"Built-in self-test for inter-layer vias in monolithic 3-D ICs","author":"chaudhuri","year":"2019","journal-title":"Proc ETS"},{"key":"ref16","year":"2018"},{"key":"ref17","year":"2018"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2185930"},{"key":"ref19","first-page":"200","article-title":"A 4 Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability","author":"sheu","year":"2011","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref4","first-page":"478","article-title":"An N40 256K x 44 embedded RRAM macro with SL-precharge SA and low-voltage current limiter to improve read and write performance","author":"chou","year":"2018","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3041026"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3323486"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757457"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2967013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627642"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2864290"},{"key":"ref1","first-page":"1","article-title":"Monolithic 3-D integrated circuits","author":"wong","year":"2007","journal-title":"Proc VLSI-TSA"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3177540.3178244"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0362"}],"container-title":["IEEE Design &amp; Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/9185117\/09072115.pdf?arnumber=9072115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T17:21:38Z","timestamp":1651080098000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9072115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":20,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2020.2988657","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,8]]}}}