{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,30]],"date-time":"2026-05-30T03:13:23Z","timestamp":1780110803032,"version":"3.54.0"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2022,6]]},"DOI":"10.1109\/mdat.2021.3070245","type":"journal-article","created":{"date-parts":[[2021,3,31]],"date-time":"2021-03-31T19:35:20Z","timestamp":1617219320000},"page":"45-53","source":"Crossref","is-referenced-by-count":11,"title":["FaCT-LSTM: Fast and Compact Ternary Architecture for LSTM Recurrent Neural Networks"],"prefix":"10.1109","volume":"39","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8013-2414","authenticated-orcid":false,"given":"Seyed Ahmad","family":"Mirsalari","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3094-9439","authenticated-orcid":false,"given":"Najmeh","family":"Nazari","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5951-9374","authenticated-orcid":false,"given":"Sima","family":"Sinaei","sequence":"additional","affiliation":[{"name":"Research Institute of Sweden (RISE), Västerås, Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1733-6056","authenticated-orcid":false,"given":"Mostafa E.","family":"Salehi","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6289-1521","authenticated-orcid":false,"given":"Masoud","family":"Daneshtalab","sequence":"additional","affiliation":[{"name":"Mälardalen University, Västerås, Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2018.8556674"},{"key":"ref3","article-title":"Alternating multi-bit quantization for recurrent neural networks","author":"xu","year":"2018","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref10","year":"2019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180634"},{"key":"ref11","first-page":"317","article-title":"Nutzung der EKG-Signaldatenbank CARDIODAT der PTB ïber das Internet","volume":"40","author":"bousseljot","year":"1995","journal-title":"Biomedizinische Technik"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PDP50117.2020.00033"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2475119"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2019.00052"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_32"},{"key":"ref2","article-title":"Binary neural networks","author":"nazari","year":"2020","journal-title":"Hardware Architectures for Deep Learning"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2016.2582924"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2020.2975903"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/9761171\/09391696.pdf?arnumber=9391696","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,5]],"date-time":"2022-12-05T22:27:05Z","timestamp":1670279225000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9391696\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6]]},"references-count":12,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2021.3070245","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,6]]}}}