{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T14:58:33Z","timestamp":1776956313581,"version":"3.51.4"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1652866"],"award-info":[{"award-number":["1652866"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1919147"],"award-info":[{"award-number":["1919147"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["C-BRIC"],"award-info":[{"award-number":["C-BRIC"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/mdat.2021.3139047","type":"journal-article","created":{"date-parts":[[2021,12,27]],"date-time":"2021-12-27T20:56:17Z","timestamp":1640638577000},"page":"71-80","source":"Crossref","is-referenced-by-count":11,"title":["Improving DNN Hardware Accuracy by In-Memory Computing Noise Injection"],"prefix":"10.1109","volume":"39","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6305-1935","authenticated-orcid":false,"given":"Sai Kiran","family":"Cherupally","sequence":"first","affiliation":[{"name":"Arizona State University, Tempe, AZ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7703-5020","authenticated-orcid":false,"given":"Jian","family":"Meng","sequence":"additional","affiliation":[{"name":"Arizona State University, Tempe, AZ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6056-2625","authenticated-orcid":false,"given":"Adnan Siraj","family":"Rakin","sequence":"additional","affiliation":[{"name":"Arizona State University, Tempe, AZ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7186-0946","authenticated-orcid":false,"given":"Shihui","family":"Yin","sequence":"additional","affiliation":[{"name":"Huawei Technologies, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9722-0979","authenticated-orcid":false,"given":"Mingoo","family":"Seok","sequence":"additional","affiliation":[{"name":"Columbia University, New York, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7989-6297","authenticated-orcid":false,"given":"Deliang","family":"Fan","sequence":"additional","affiliation":[{"name":"Arizona State University, Tempe, AZ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jae-Sun","family":"Seo","sequence":"additional","affiliation":[{"name":"Arizona State University, Tempe, AZ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"242","article-title":"A 351 TOPS\/W and 372.4 GOPS compute-in-memory SRAM macro in 7 nm FinFET CMOS for machine-learning applications","author":"dong","year":"2020","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963616"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2016.7472782"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2992886"},{"key":"ref11","first-page":"244","article-title":"A 22 nm 2 Mb ReRAM compute-in-memory macro with 121-28 TOPS\/W for multibit MAC computing for tiny AI edge devices","author":"xue","year":"2020","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2867275"},{"key":"ref12","first-page":"4107","article-title":"Binarized neural networks","author":"hubara","year":"2016","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref8","article-title":"Noisy machines: Understanding noisy neural networks and enhancing robustness to analog hardware errors using distillation","author":"zhou","year":"2020","journal-title":"arXiv 2001 04974"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16108-9"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2960488"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2020.2992306"},{"key":"ref1","first-page":"1","article-title":"Accurate and efficient 2-bit quantized neural networks","author":"choi","year":"2019","journal-title":"Proc Conf Mach Learn Syst (MLSys)"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/6221038\/9803229\/9663371-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/9803229\/09663371.pdf?arnumber=9663371","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T19:57:46Z","timestamp":1657569466000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9663371\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":12,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2021.3139047","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}