{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:21:56Z","timestamp":1781886116321,"version":"3.54.5"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000780","name":"European Commission","doi-asserted-by":"publisher","award":["722325"],"award-info":[{"award-number":["722325"]}],"id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.1109\/mdat.2022.3188573","type":"journal-article","created":{"date-parts":[[2022,7,5]],"date-time":"2022-07-05T19:18:44Z","timestamp":1657048724000},"page":"109-117","source":"Crossref","is-referenced-by-count":11,"title":["Using STLs for Effective In-Field Test of GPUs"],"prefix":"10.1109","volume":"40","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5957-5624","authenticated-orcid":false,"given":"Josie E.","family":"Rodriguez Condia","sequence":"first","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9371-5296","authenticated-orcid":false,"given":"Felipe Augusto","family":"da Silva","sequence":"additional","affiliation":[{"name":"Cadence Design Systems, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ahmet \u00c7a\u011fr\u0131","family":"Ba\u011fbaga","sequence":"additional","affiliation":[{"name":"Cadence Design Systems, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6852-2372","authenticated-orcid":false,"given":"Juan-David","family":"Guerrero-Balaguera","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8961-0387","authenticated-orcid":false,"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"Delft University of Technology, Delft, The Netherlands"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Christian","family":"Sauer","sequence":"additional","affiliation":[{"name":"Cadence Design Systems, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2899-7669","authenticated-orcid":false,"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Turin, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2807591.2807666"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758636"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569353"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2968139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113660"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2498546"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS52668.2021.9417025"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2019.8854463"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-81641-4_10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS48528.2020.9131568"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2014.6834876"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10066123\/09815288.pdf?arnumber=9815288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,25]],"date-time":"2024-06-25T18:44:22Z","timestamp":1719341062000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9815288\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":12,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2022.3188573","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,4]]}}}