{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T03:57:54Z","timestamp":1771473474769,"version":"3.50.1"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61971230"],"award-info":[{"award-number":["61971230"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research & Practice Innovation Program of Jiangsu Province","award":["KYCX20_0966"],"award-info":[{"award-number":["KYCX20_0966"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.1109\/mdat.2022.3202858","type":"journal-article","created":{"date-parts":[[2022,8,29]],"date-time":"2022-08-29T20:48:21Z","timestamp":1661806101000},"page":"118-126","source":"Crossref","is-referenced-by-count":2,"title":["T-Topology Coupler-Based Bandpass Negative Group Delay Active Circuit Design and Test"],"prefix":"10.1109","volume":"40","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7613-226X","authenticated-orcid":false,"given":"Taochen","family":"Gu","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, Nanjing University of Information Science & Technology (NUIST), Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5626-6065","authenticated-orcid":false,"given":"Fayu","family":"Wan","sequence":"additional","affiliation":[{"name":"Nanjing Institute of Measurement and Testing Technology, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0829-6358","authenticated-orcid":false,"given":"Jingjie","family":"Zhou","sequence":"additional","affiliation":[{"name":"Nanjing Institute of Measurement and Testing Technology, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8066-1260","authenticated-orcid":false,"given":"Qizheng","family":"Ji","sequence":"additional","affiliation":[{"name":"National Key Laboratory on Electromagnetic Environment Effects, Army Engineering University of PLA, Shijiazhuang, China"}]},{"given":"Binhong","family":"Li","sequence":"additional","affiliation":[{"name":"Key Laboratory of Silicon Device Technology, Chinese Academy of Sciences, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7334-5016","authenticated-orcid":false,"given":"Blaise","family":"Ravelo","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, Nanjing University of Information Science & Technology (NUIST), Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1119\/1.18813"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2002.807979"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/cta.1902"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2003.817556"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-map.2017.0357"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2011.2132696"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/electronics7090158"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2017.2745487"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2320220"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2107251"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2845411"},{"key":"ref12","volume-title":"Mini-Circuits Monolithic Amplifier LEE-9+","year":"2020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.23173"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2018.2811254"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3056221"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10066123\/09869877.pdf?arnumber=9869877","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T12:39:40Z","timestamp":1706791180000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9869877\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":15,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2022.3202858","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,4]]}}}