{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T06:07:58Z","timestamp":1747375678601,"version":"3.37.3"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2024,4]]},"DOI":"10.1109\/mdat.2023.3283349","type":"journal-article","created":{"date-parts":[[2023,6,7]],"date-time":"2023-06-07T02:56:33Z","timestamp":1686106593000},"page":"15-22","source":"Crossref","is-referenced-by-count":3,"title":["Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1587-9877","authenticated-orcid":false,"given":"Ke","family":"Huang","sequence":"first","affiliation":[{"name":"San Diego State University, San Diego, CA, USA"}]},{"given":"Yu","family":"Liu","sequence":"additional","affiliation":[{"name":"Samsung Research, Plano, TX, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2224-8157","authenticated-orcid":false,"given":"Nenad","family":"Korolija","sequence":"additional","affiliation":[{"name":"University of Belgrade, Belgrade, Serbia"}]},{"given":"John M.","family":"Carulli","sequence":"additional","affiliation":[{"name":"Globalfoundries, Malta, NY, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4322-0068","authenticated-orcid":false,"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, The University of Texas at Dallas, Richardson, TX, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2409267"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000118"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2018.8565651"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8623833"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2016.2631534"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3023684"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED48828.2020.9136972"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3115247"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3015451"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2899477"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3513087"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2332291"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s42979-020-00329-2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS45731.2020.9180407"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2933278"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3563391"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2017.2728366"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378191"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10443099\/10144757.pdf?arnumber=10144757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T09:17:30Z","timestamp":1709284650000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10144757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4]]},"references-count":18,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2023.3283349","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2024,4]]}}}