{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T10:04:10Z","timestamp":1767261850133,"version":"3.37.3"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/mdat.2023.3309743","type":"journal-article","created":{"date-parts":[[2023,8,29]],"date-time":"2023-08-29T17:56:59Z","timestamp":1693331819000},"page":"51-63","source":"Crossref","is-referenced-by-count":3,"title":["ELEMENT: Energy-Efficient Multi-NoP Architecture for IMC-Based 2.5-D Accelerator for DNN Training"],"prefix":"10.1109","volume":"40","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5897-7146","authenticated-orcid":false,"given":"K.","family":"Neethu","sequence":"first","affiliation":[{"name":"Division of Electronics Engineering School of Engineering, Cochin University of Science and Technology, Cochin, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K. C. Sharin","family":"Shahana","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Automation, Indian Institute of Science, Bangalore, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rekha K.","family":"James","sequence":"additional","affiliation":[{"name":"Division of Electronics Engineering School of Engineering, Cochin University of Science and Technology, Cochin, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0314-8778","authenticated-orcid":false,"given":"John","family":"Jose","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, Indian Institute of Technology Guwahati, Guwahati, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9294-1603","authenticated-orcid":false,"given":"Sumit K.","family":"Mandal","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Automation, Indian Institute of Science, Bangalore, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA45697.2020.00073"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2789723"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3220195"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA47549.2020.00015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/make1010005"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3389\/fncom.2021.674154"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.25103\/jestr.095.23"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/774789.774805"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2013.6557149"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2616357"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3307650.3322237"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2654822.2541967"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2830772.2830808"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203849"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3197500"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3476999"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10288420\/10233885.pdf?arnumber=10233885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,6]],"date-time":"2023-11-06T19:39:05Z","timestamp":1699299545000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10233885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":18,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2023.3309743","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}