{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:36:45Z","timestamp":1740170205886,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","award":["556429-20"],"award-info":[{"award-number":["556429-20"]}],"id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003816","name":"Huawei Technologies","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003816","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2024,4]]},"DOI":"10.1109\/mdat.2023.3314672","type":"journal-article","created":{"date-parts":[[2023,9,18]],"date-time":"2023-09-18T18:01:53Z","timestamp":1695060113000},"page":"65-74","source":"Crossref","is-referenced-by-count":1,"title":["VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4572-362X","authenticated-orcid":false,"given":"Yuxuan","family":"Pan","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of British Columbia, Vancouver, Canada"}]},{"given":"Zhonghua","family":"Zhou","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of British Columbia, Vancouver, Canada"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6918-6008","authenticated-orcid":false,"given":"S. Arash","family":"Sheikholeslam","sequence":"additional","affiliation":[{"name":"International Monetary Fund, Washington, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0882-6750","authenticated-orcid":false,"given":"Andr\u00e9","family":"Ivanov","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of British Columbia, Vancouver, Canada"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218646"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED54688.2022.9806228"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3590768"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240843"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2917130"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3372780.3375557"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3126676"},{"key":"ref8","first-page":"1","article-title":"Pin accessibility prediction and optimization with deep learning-based pin pattern recognition","volume-title":"Proc. 56th Annu. Design Autom. Conf.","author":"Yu"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364463"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942107"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2008.239"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3194554.3194579"},{"volume-title":"ISPD 2015 Blockage-Aware Detailed Routing-Driven Placement Contest","year":"2015","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287678"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2011.2161285"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401274"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10443099\/10254268.pdf?arnumber=10254268","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T20:25:23Z","timestamp":1710361523000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10254268\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4]]},"references-count":16,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2023.3314672","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2024,4]]}}}