{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:35:46Z","timestamp":1740170146495,"version":"3.37.3"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T00:00:00Z","timestamp":1706745600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2024,2]]},"DOI":"10.1109\/mdat.2023.3324518","type":"journal-article","created":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T18:28:56Z","timestamp":1705516136000},"page":"93-94","source":"Crossref","is-referenced-by-count":0,"title":["ISLPED 2023: International Symposium on Low-Power Electronics and Design"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2251-0004","authenticated-orcid":false,"given":"Axel","family":"Jantsch","sequence":"first","affiliation":[{"name":"Institute of Computer Technology TU Wien, Vienna, Austria"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8753-490X","authenticated-orcid":false,"given":"Swaroop","family":"Ghosh","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Computer Science, The Pennsylvania State University, University Park, PA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5045-5535","authenticated-orcid":false,"given":"Umit","family":"Ogras","sequence":"additional","affiliation":[{"name":"Electrical and Computer Engineering Department, University of Wisconsin–Madison, Madison, WI, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5444-5772","authenticated-orcid":false,"given":"Pascal","family":"Meinerzhagen","sequence":"additional","affiliation":[{"name":"Intel, Muri bei Bern, Switzerland"}]}],"member":"263","container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10402574\/10402585.pdf?arnumber=10402585","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,19]],"date-time":"2024-01-19T18:48:39Z","timestamp":1705690119000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10402585\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2]]},"references-count":0,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2023.3324518","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2024,2]]}}}