{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:46:25Z","timestamp":1764175585063,"version":"3.37.3"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,1]],"date-time":"2024-06-01T00:00:00Z","timestamp":1717200000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2024,6]]},"DOI":"10.1109\/mdat.2024.3365958","type":"journal-article","created":{"date-parts":[[2024,2,14]],"date-time":"2024-02-14T18:43:19Z","timestamp":1707936199000},"page":"21-28","source":"Crossref","is-referenced-by-count":6,"title":["A BIST Approach to Approximate Co-Testing of Embedded Data Converters"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3283-7449","authenticated-orcid":false,"given":"Kushagra","family":"Bhatheja","sequence":"first","affiliation":[{"name":"Texas Instruments Inc, Tucson, AZ, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5930-5894","authenticated-orcid":false,"given":"Shravan","family":"Chaganti","sequence":"additional","affiliation":[{"name":"Texas Instruments Inc, Houston, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Johnathan","family":"Leisinger","sequence":"additional","affiliation":[{"name":"Iowa State University, Ames, IA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-8237-2384","authenticated-orcid":false,"given":"Emmanuel Nti","family":"Darko","sequence":"additional","affiliation":[{"name":"Iowa State University, Ames, IA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3959-1293","authenticated-orcid":false,"given":"Isaac","family":"Bruce","sequence":"additional","affiliation":[{"name":"Iowa State University, Ames, IA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5938-6329","authenticated-orcid":false,"given":"Degang","family":"Chen","sequence":"additional","affiliation":[{"name":"Iowa State University, Ames, IA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/vdat50263.2020.9190571"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2023.10285677"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2011.5692956"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/test.1993.470621"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/vtest.2003.1197637"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2010.2063443"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2017.2775632"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc.2018.8409877"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc.2018.8409605"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/itc50671.2022.00063"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/test.2012.6401561"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/test.2018.8624753"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221038\/10507088\/10436136.pdf?arnumber=10436136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,3]],"date-time":"2024-05-03T18:51:24Z","timestamp":1714762284000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10436136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6]]},"references-count":12,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2024.3365958","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"type":"print","value":"2168-2356"},{"type":"electronic","value":"2168-2364"}],"subject":[],"published":{"date-parts":[[2024,6]]}}}