{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:31:50Z","timestamp":1780500710840,"version":"3.54.1"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2024,12]]},"DOI":"10.1109\/mdat.2024.3425791","type":"journal-article","created":{"date-parts":[[2024,7,10]],"date-time":"2024-07-10T17:32:48Z","timestamp":1720632768000},"page":"46-53","source":"Crossref","is-referenced-by-count":3,"title":["On the Relation Between Reliability and Entropy in Physical Unclonable Functions"],"prefix":"10.1109","volume":"41","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-7513-2389","authenticated-orcid":false,"given":"Vasilii","family":"Kulagin","sequence":"first","affiliation":[{"name":"Université Grenoble Alpes, CNRS, Grenoble INP, TIMA, Grenoble, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7460-3187","authenticated-orcid":false,"given":"Sergio Vinagrero","family":"Gutierrez","sequence":"additional","affiliation":[{"name":"Université Grenoble Alpes, CNRS, Grenoble INP, TIMA, Grenoble, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7911-2889","authenticated-orcid":false,"given":"Tobias","family":"Kilian","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniel","family":"Tille","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4431-7619","authenticated-orcid":false,"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[{"name":"Technical University of Munich, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8063-5388","authenticated-orcid":false,"given":"Giorgio","family":"Di Natale","sequence":"additional","affiliation":[{"name":"Université Grenoble Alpes, CNRS, Grenoble INP, TIMA, Grenoble, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4588-1812","authenticated-orcid":false,"given":"Elena-Ioana","family":"Vatajelu","sequence":"additional","affiliation":[{"name":"Université Grenoble Alpes, CNRS, Grenoble INP, TIMA, Grenoble, France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278484"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/science.1074376"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/952532.952593"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2487726.2487730"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS59296.2023.10224877"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513108"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2017.2727546"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5745-6"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_17"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/dsd.2018.00096"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2019.8854401"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6221038\/10736195\/10592032.pdf?arnumber=10592032","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T23:31:59Z","timestamp":1732663919000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10592032\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12]]},"references-count":12,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2024.3425791","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,12]]}}}