{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,12]],"date-time":"2026-10-12T14:07:39Z","timestamp":1791814059825,"version":"4.3.4"},"reference-count":1,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/mdat.2024.3513652","type":"journal-article","created":{"date-parts":[[2025,1,16]],"date-time":"2025-01-16T18:44:00Z","timestamp":1737053040000},"page":"70-70","source":"Crossref","is-referenced-by-count":1,"title":["Erratum to \u201cEthical Design of Computers: From Semiconductors to IoT and Artificial Intelligence\u201d"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0846-0066","authenticated-orcid":false,"given":"Sudeep","family":"Pasricha","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4742-0841","authenticated-orcid":false,"given":"Marilyn","family":"Wolf","sequence":"additional","affiliation":[{"name":"School of Computing, University of Nebraska\u2013Lincoln, Lincoln, NE, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/mdat.2023.3277815"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6221038\/10843973\/10843998.pdf?arnumber=10843998","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T18:43:50Z","timestamp":1738089830000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10843998\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":1,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2024.3513652","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}