{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T16:32:17Z","timestamp":1775579537639,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/mdat.2025.3602741","type":"journal-article","created":{"date-parts":[[2025,8,26]],"date-time":"2025-08-26T19:22:44Z","timestamp":1756236164000},"page":"40-53","source":"Crossref","is-referenced-by-count":4,"title":["Silent Data Corruption by 10\u00d7 Test Escapes Threatens Reliable Computing"],"prefix":"10.1109","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5572-5194","authenticated-orcid":false,"given":"Subhasish","family":"Mitra","sequence":"first","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"given":"Subho S.","family":"Banerjee","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-4933-4167","authenticated-orcid":false,"given":"Martin","family":"Dixon","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"given":"Mike","family":"Fuller","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"given":"Rama","family":"Govindaraju","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-4681-6457","authenticated-orcid":false,"given":"Peter","family":"Hochschild","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-3025-454X","authenticated-orcid":false,"given":"Eric X.","family":"Liu","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-3566-4591","authenticated-orcid":false,"given":"Bharath","family":"Parthasarathy","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9751-5902","authenticated-orcid":false,"given":"Parthasarathy","family":"Ranganathan","sequence":"additional","affiliation":[{"name":"Google, Mountain View, CA, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0898-1221(87)90074-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2752705"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2024.3483028"},{"key":"ref4","article-title":"Silent data corruptions at scale","author":"Dixit","year":"2021","journal-title":"arXiv:2102.11245"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3676641.3716258"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139151"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETS56758.2023.10173972"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref9","article-title":"Finding faulty components in a live fleet environment","author":"Inkley","year":"2024"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758636"},{"key":"ref11","volume-title":"Microprogrammed Control and Reliable Design of Small Computers","author":"Kraft","year":"1981"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.76"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2013.6658544"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484786"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.152"},{"key":"ref16","article-title":"Online self-test, diagnostics, and self-repair for robust system design","author":"Li","year":"2013"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00083"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2334301"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894311"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ETS61313.2024.10567760"},{"key":"ref22","first-page":"1","article-title":"IC-PEPR: PEPR testing goes intra-cell","volume-title":"Proc. IEEE Int. Test Conf.","author":"Nigh"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/24.994913"},{"key":"ref24","article-title":"Computing\u2019s hidden menace: The OCP takes action against silent data corruption (SDC)","author":"Parthasarathy","year":"2024","journal-title":"Open Compute Project (OCP)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035276"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1985.294793"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ITC51657.2024.00061"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/3600006.3613149"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VTS65138.2025.11022877"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6221038\/11219247\/11142270.pdf?arnumber=11142270","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,29]],"date-time":"2025-10-29T17:39:15Z","timestamp":1761759555000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11142270\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":29,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdat.2025.3602741","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}