{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T06:10:19Z","timestamp":1742019019659,"version":"3.38.0"},"reference-count":7,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2002,5,1]],"date-time":"2002-05-01T00:00:00Z","timestamp":1020211200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2002,5]]},"DOI":"10.1109\/mdt.2002.1003795","type":"journal-article","created":{"date-parts":[[2005,4,21]],"date-time":"2005-04-21T20:22:11Z","timestamp":1114114931000},"page":"44-53","source":"Crossref","is-referenced-by-count":9,"title":["IP for embedded diagnosis"],"prefix":"10.1109","volume":"19","author":[{"given":"S.","family":"Pateras","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/6.542274"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/NORTHC.1996.564944"},{"volume-title":"Design for At-Speed Test, Diagnosis and Measurement","year":"2000","author":"Nadeau-Dostie","key":"ref3"},{"volume-title":"Testing Semiconductor Memories: Theory and Practice","year":"1991","author":"van de Goor","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.1995.122623"},{"volume-title":"Built-In Test for VLSI: Pseudorandom Techniques","year":"1988","author":"Bardell","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894191"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/21673\/01003795.pdf?arnumber=1003795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:31:32Z","timestamp":1742016692000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1003795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,5]]},"references-count":7,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2002.1003795","relation":{},"ISSN":["0740-7475"],"issn-type":[{"type":"print","value":"0740-7475"}],"subject":[],"published":{"date-parts":[[2002,5]]}}}