{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T17:09:10Z","timestamp":1694624950471},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2002,9]]},"DOI":"10.1109\/mdt.2002.1033786","type":"journal-article","created":{"date-parts":[[2005,4,21]],"date-time":"2005-04-21T16:22:11Z","timestamp":1114100531000},"page":"5-7","source":"Crossref","is-referenced-by-count":0,"title":["Guest editors' introduction: defect-oriented testing in the deep-submicron era"],"prefix":"10.1109","volume":"19","author":[{"given":"J.","family":"Segura","sequence":"first","affiliation":[]},{"given":"P.","family":"Maxwell","sequence":"additional","affiliation":[]}],"member":"263","container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/22200\/01033786.pdf?arnumber=1033786","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:44:49Z","timestamp":1641987889000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1033786\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,9]]},"references-count":0,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2002.1033786","relation":{},"ISSN":["0740-7475"],"issn-type":[{"value":"0740-7475","type":"print"}],"subject":[],"published":{"date-parts":[[2002,9]]}}}