{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:40:08Z","timestamp":1742017208529,"version":"3.38.0"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2002,9,1]],"date-time":"2002-09-01T00:00:00Z","timestamp":1030838400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2002,9]]},"DOI":"10.1109\/mdt.2002.1033789","type":"journal-article","created":{"date-parts":[[2003,1,3]],"date-time":"2003-01-03T17:55:00Z","timestamp":1041616500000},"page":"27-35","source":"Crossref","is-referenced-by-count":29,"title":["Noise generation and coupling mechanisms in deep-submicron ICs"],"prefix":"10.1109","volume":"19","author":[{"given":"X.","family":"Aragones","sequence":"first","affiliation":[{"name":"Univ. Politecnica de Catalunya, Barcelona, Spain"}]},{"given":"J.L.","family":"Gonzalez","sequence":"additional","affiliation":[{"name":"Univ. Politecnica de Catalunya, Barcelona, Spain"}]},{"given":"F.","family":"Moll","sequence":"additional","affiliation":[{"name":"Univ. Politecnica de Catalunya, Barcelona, Spain"}]},{"given":"A.","family":"Rubio","sequence":"additional","affiliation":[{"name":"Univ. Politecnica de Catalunya, Barcelona, Spain"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597223"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805629"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/vtest.1999.766652"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/92.924055"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1999.810665"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1994.367232"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/82.199902"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743208"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.792616"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.848086"},{"volume-title":"SubstrateStorm, release 3.x, Simplex Solutions","year":"2000","key":"ref11"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/22200\/01033789.pdf?arnumber=1033789","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:15:54Z","timestamp":1742015754000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1033789\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,9]]},"references-count":11,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2002.1033789","relation":{},"ISSN":["0740-7475","1558-1918"],"issn-type":[{"type":"print","value":"0740-7475"},{"type":"electronic","value":"1558-1918"}],"subject":[],"published":{"date-parts":[[2002,9]]}}}