{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:52:43Z","timestamp":1759146763424,"version":"3.38.0"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2002,11,1]],"date-time":"2002-11-01T00:00:00Z","timestamp":1036108800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2002,11]]},"DOI":"10.1109\/mdt.2002.1047745","type":"journal-article","created":{"date-parts":[[2003,1,3]],"date-time":"2003-01-03T17:55:00Z","timestamp":1041616500000},"page":"64-72","source":"Crossref","is-referenced-by-count":60,"title":["Practical oscillation-based test of integrated filters"],"prefix":"10.1109","volume":"19","author":[{"given":"G.","family":"Huertas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Vazquez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.J.","family":"Peralias","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Rueda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.L.","family":"Huertas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/VTEST.1996.510896"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/43.644035"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/EDTC.1997.582431"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/19.779176"},{"key":"ref5","first-page":"249","article-title":"Oscillation-Based Test Experiments in Filters: A DTMF Example","volume-title":"Proc. 5th IEEE Int\u2019l Mixed-Signal Test Workshop","author":"Huertas","year":"1999"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TEST.1999.805779"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/MDT.2002.1047746"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1115\/1.3426360"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1002\/j.1538-7305.1979.tb02965.x"},{"volume-title":"Users\u2019 Manual for SWITCAP2 Version 1.1, Dept. Electrical Eng. and Center for Telecommunications Research","year":"1992","key":"ref10"},{"volume-title":"Spectre User Guide, Version 4.4.1, Cadence Design Systems","year":"1997","key":"ref11"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/DAC.1997.597158"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/22460\/01047745.pdf?arnumber=1047745","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T05:19:03Z","timestamp":1742015943000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1047745\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,11]]},"references-count":12,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2002,11]]}},"URL":"https:\/\/doi.org\/10.1109\/mdt.2002.1047745","relation":{},"ISSN":["0740-7475"],"issn-type":[{"type":"print","value":"0740-7475"}],"subject":[],"published":{"date-parts":[[2002,11]]}}}