{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,17]],"date-time":"2025-03-17T04:04:38Z","timestamp":1742184278712,"version":"3.38.0"},"reference-count":7,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2003,1,1]],"date-time":"2003-01-01T00:00:00Z","timestamp":1041379200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2003,1]]},"DOI":"10.1109\/mdt.2003.1173052","type":"journal-article","created":{"date-parts":[[2003,3,7]],"date-time":"2003-03-07T18:58:16Z","timestamp":1047063496000},"page":"42-50","source":"Crossref","is-referenced-by-count":3,"title":["Testing and characterization of SDRAMs"],"prefix":"10.1109","volume":"20","author":[{"given":"J.E.","family":"Vollrath","sequence":"first","affiliation":[]}],"member":"263","reference":[{"volume-title":"Testing Semiconductor Memories","year":"1991","author":"Van de Goor","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.634660"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894234"},{"key":"ref4","first-page":"222","article-title":"Application of a Bitmap Analysis System to the Forefront of DRAM Devices Development","volume-title":"Proc. IEEE\/SIMI Advanced Semiconductor Manufacturing Conf. (ASMC)","author":"Sugimoto","year":"1997"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1994.397201"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639616"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/54.606005"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/26361\/01173052.pdf?arnumber=1173052","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,16]],"date-time":"2025-03-16T04:09:26Z","timestamp":1742098166000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173052\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,1]]},"references-count":7,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2003.1173052","relation":{},"ISSN":["0740-7475"],"issn-type":[{"type":"print","value":"0740-7475"}],"subject":[],"published":{"date-parts":[[2003,1]]}}}