{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,17]],"date-time":"2025-03-17T04:04:58Z","timestamp":1742184298037,"version":"3.38.0"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2003,3,1]],"date-time":"2003-03-01T00:00:00Z","timestamp":1046476800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2003,3]]},"DOI":"10.1109\/mdt.2003.1188261","type":"journal-article","created":{"date-parts":[[2003,3,26]],"date-time":"2003-03-26T21:30:05Z","timestamp":1048714205000},"page":"40-47","source":"Crossref","is-referenced-by-count":5,"title":["Fast fault simulation for nonlinear analog circuits"],"prefix":"10.1109","volume":"20","author":[{"given":"N.","family":"Engin","sequence":"first","affiliation":[]},{"given":"H.G.","family":"Kerkhoff","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"refs1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1998.655964"},{"volume-title":"The Theory of Matrices in Numerical Analysis","year":"1964","author":"Householder","key":"refs2"},{"key":"refs3","first-page":"28","article-title":"Fast Fault Simulation in Linear and Nonlinear Circuits with Fault Rubber Stamps","volume-title":"Proc. 4th IEEE Int\u2019l Mixed-Signal Testing Workshop","author":"Augusto"},{"key":"refs4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144295"},{"key":"refs5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1999.761129"},{"key":"refs6","first-page":"42","article-title":"Concurrent Analogue Fault Simulation","volume-title":"Proc. 3rd IEEE Int\u2019l Mixed-Signal Testing Workshop","author":"Zwolinski"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470319"},{"key":"ref2","first-page":"42","article-title":"Concurrent Analogue Fault Simulation","volume-title":"Proc. 3rd IEEE Int\u2019l Mixed-Signal Testing Workshop","author":"Zwolinski","year":"1997"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.1999.804423"},{"volume-title":"Fundamentals of Computer-Aided Circuit Simulation","year":"1988","author":"McCalla","key":"ref4"},{"key":"ref5","article-title":"Linking Mixed-Signal Design and Test: Generation and Evaluation of Specification-Based Tests","volume-title":"Faculty of Electrical Eng.","author":"Engin","year":"2000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1998.655964"},{"key":"ref7","first-page":"28","article-title":"Fast Fault Simulation in Linear and Nonlinear Circuits with Fault Rubber Stamps","volume-title":"Proc. 4th IEEE Int\u2019l Mixed-Signal Testing Workshop","author":"Augusto","year":"1998"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639612"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:19970870"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/26637\/01188261.pdf?arnumber=1188261","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,16]],"date-time":"2025-03-16T04:14:08Z","timestamp":1742098448000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1188261\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,3]]},"references-count":15,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2003.1188261","relation":{},"ISSN":["0740-7475"],"issn-type":[{"type":"print","value":"0740-7475"}],"subject":[],"published":{"date-parts":[[2003,3]]}}}