{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,17]],"date-time":"2025-03-17T04:05:36Z","timestamp":1742184336746,"version":"3.38.0"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2003,7,1]],"date-time":"2003-07-01T00:00:00Z","timestamp":1057017600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2003,7]]},"DOI":"10.1109\/mdt.2003.1214348","type":"journal-article","created":{"date-parts":[[2003,7,23]],"date-time":"2003-07-23T15:30:38Z","timestamp":1058974238000},"page":"16-21","source":"Crossref","is-referenced-by-count":10,"title":["Solving satisfiability in combinational circuits"],"prefix":"10.1109","volume":"20","author":[{"given":"J.","family":"Marques-Silva","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Guerra e Silva","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","first-page":"191","article-title":"Solving Satisfiability in CAD Problems","volume-title":"Proc. Cadence Technical Conf.","author":"Saldanha","year":"1997"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.1999.803118"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1999.761110"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1996.569607"},{"key":"ref5","first-page":"203","article-title":"Using CSP Look-Back Techniques to Solve Real-World SAT Instances","volume-title":"Proc. Nat\u2019l Conf. Artiticial lntelligence","author":"Bayardo","year":"1997"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1997.643607"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/321033.321034"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2572-8"},{"volume-title":"Digital Systems Testing and Testable Design","year":"1990","author":"Abramovici","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45349-0_36"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379017"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998262"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/27302\/01214348.pdf?arnumber=1214348","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,16]],"date-time":"2025-03-16T04:23:19Z","timestamp":1742098999000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1214348\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,7]]},"references-count":12,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2003.1214348","relation":{},"ISSN":["0740-7475"],"issn-type":[{"type":"print","value":"0740-7475"}],"subject":[],"published":{"date-parts":[[2003,7]]}}}