{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,31]],"date-time":"2024-08-31T05:53:40Z","timestamp":1725083620578},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,2,1]],"date-time":"2012-02-01T00:00:00Z","timestamp":1328054400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2012,2]]},"DOI":"10.1109\/mdt.2011.2178587","type":"journal-article","created":{"date-parts":[[2012,2,7]],"date-time":"2012-02-07T22:02:33Z","timestamp":1328652153000},"page":"36-47","source":"Crossref","is-referenced-by-count":24,"title":["Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations"],"prefix":"10.1109","volume":"29","author":[{"given":"Ronald DeShawn","family":"Blanton","sequence":"first","affiliation":[]},{"given":"Wing Chiu","family":"Tam","sequence":"additional","affiliation":[]},{"given":"Xiaochun","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Jeffrey E.","family":"Nelson","sequence":"additional","affiliation":[]},{"given":"Osei","family":"Poku","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.117"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243807"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024740"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271073"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.870836"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391568"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.49"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/el:19830156"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699231"},{"key":"ref4","first-page":"1","article-title":"Systematic defect identification through layout snippet clustering","author":"poku","year":"2010","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.11"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/66.382283"},{"key":"ref5","first-page":"10","article-title":"Yield diagnosis through interpretation of tester data","author":"maly","year":"1987","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref8","first-page":"1","article-title":"A logic diagnosis methodology for improved localization and extraction of accurate defect behavior","author":"desineni","year":"2006","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"366","DOI":"10.1109\/VTS.2005.41","article-title":"Diagnosis of arbitrary defects using neighborhood function extraction","author":"desineni","year":"2005","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297715"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041768"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699270"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783779"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/6198418\/06148305.pdf?arnumber=6148305","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:50Z","timestamp":1633909910000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6148305\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,2]]},"references-count":20,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2011.2178587","relation":{},"ISSN":["0740-7475"],"issn-type":[{"value":"0740-7475","type":"print"}],"subject":[],"published":{"date-parts":[[2012,2]]}}}