{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T02:28:22Z","timestamp":1648693702266},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2012,4,1]],"date-time":"2012-04-01T00:00:00Z","timestamp":1333238400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/mdt.2012.2187858","type":"journal-article","created":{"date-parts":[[2012,7,14]],"date-time":"2012-07-14T03:05:59Z","timestamp":1342235159000},"page":"5-7","source":"Crossref","is-referenced-by-count":0,"title":["Guest Editors' Introduction: Special Issue on EDA Industry Standards"],"prefix":"10.1109","volume":"29","author":[{"given":"Shishpal S.","family":"Rawat","sequence":"first","affiliation":[]},{"given":"Sumit","family":"DasGupta","sequence":"additional","affiliation":[]}],"member":"263","container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/6239665\/06239686.pdf?arnumber=6239686","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:54:24Z","timestamp":1633910064000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6239686\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":0,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2012.2187858","relation":{},"ISSN":["0740-7475"],"issn-type":[{"value":"0740-7475","type":"print"}],"subject":[],"published":{"date-parts":[[2012,4]]}}}