{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:02:56Z","timestamp":1761580976860},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/mdt.2012.2194471","type":"journal-article","created":{"date-parts":[[2012,4,11]],"date-time":"2012-04-11T19:17:15Z","timestamp":1334171835000},"page":"77-86","source":"Crossref","is-referenced-by-count":10,"title":["Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection"],"prefix":"10.1109","volume":"30","author":[{"family":"Hsuan-Ming Huang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. H-P","family":"Wen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2007.4601927"},{"key":"ref11","first-page":"157","article-title":"On soft error rate analysis of scaled CMOS designs—A statistical perspective","author":"peng","year":"2009","journal-title":"Proc Int Conf Comput -Aided Design"},{"key":"ref12","first-page":"831","article-title":"Accurate Statistical Soft Error Rate (SSER) analysis using a Quasi-Monte Carlo framework with quality cell models","author":"kuo","year":"2010","journal-title":"Proc Int Symp Quality Electron Design"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699278"},{"key":"ref14","first-page":"1879","article-title":"Critical charge characterization for soft error rate modeling in 90 nm SRAM","author":"naseer","year":"2007","journal-title":"Proc Int Symp Circuits Syst"},{"key":"ref15","first-page":"55","year":"2001","journal-title":"Measurement and Reporting of Alpha Particles an Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices"},{"key":"ref16","author":"cristianini","year":"2002","journal-title":"An Introduction to Support Vector Machines and Other Kernel-Based Learning Methods"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICNN.1995.488968"},{"key":"ref4","first-page":"111","article-title":"A Soft Error Rate Analysis (SERA) methodology","author":"zhang","year":"2004","journal-title":"Proc Int Conf Comput -Aided Design"},{"key":"ref3","first-page":"755","article-title":"FASER: Fast analysis of soft error susceptibility for cell-based designs","author":"zhang","year":"2006","journal-title":"Proc Int Symp Quality Electronic Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.143"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"924","DOI":"10.1145\/1391469.1391703","article-title":"on the role of timing masking in reliable logic circuit design","author":"krishnaswamy","year":"2008","journal-title":"2008 45th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798241"},{"key":"ref7","first-page":"1117","article-title":"Impact of process variation on soft error vulnerability for nanometer VLSI circuits","author":"qian","year":"2005","journal-title":"Proc Int Conf ASIC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229323"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891036"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.168"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6221038\/6523949\/06182680.pdf?arnumber=6182680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:45:57Z","timestamp":1642005957000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6182680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":17,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2012.2194471","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,4]]}}}