{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,4]],"date-time":"2024-07-04T12:38:58Z","timestamp":1720096738135},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2013,8,1]],"date-time":"2013-08-01T00:00:00Z","timestamp":1375315200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1109\/mdt.2012.2217111","type":"journal-article","created":{"date-parts":[[2012,9,5]],"date-time":"2012-09-05T18:01:32Z","timestamp":1346868092000},"page":"36-48","source":"Crossref","is-referenced-by-count":7,"title":["Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs"],"prefix":"10.1109","volume":"30","author":[{"family":"Sehun Kook","sequence":"first","affiliation":[]},{"given":"Aritra","family":"Banerjee","sequence":"additional","affiliation":[]},{"given":"Abhijit","family":"Chatterjee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"Two improved methods for testing ADC parametric faults by digital input signal","author":"sheng","year":"2009","journal-title":"Proc Int Mixed-Signals Test Workshop"},{"key":"ref3","first-page":"597","article-title":"Signature-based testing for adaptive digitally-calibrated pipelined analog-to-digital converters","author":"mohamed","year":"2009","journal-title":"Proc Int Conf ASIC"},{"key":"ref10","author":"cherubal","year":"2006","journal-title":"Fault isolation and diagnosis techniques for mixed-signal circuits"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017542"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.808892"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref12","author":"goldberg","year":"1989","journal-title":"Genetic Algorithms in Search Optimization and Machine Learning"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512726"},{"key":"ref2","first-page":"55","article-title":"New test access for high resolution <ref_formula><tex Notation=\"TeX\">$\\Delta\\Sigma$<\/tex> <\/ref_formula> ADCs by using the noise transfer function evaluation","author":"venuto","year":"2007","journal-title":"Proc Int Mixed Signal Testing Workshop"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.65"},{"key":"ref1","first-page":"-645i","article-title":"Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations","volume":"1","author":"yu","year":"2004","journal-title":"Proc Int Symp Circuits Syst"}],"container-title":["IEEE Design &amp; Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6221038\/6658894\/06296281.pdf?arnumber=6296281","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:46:01Z","timestamp":1642005961000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6296281\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8]]},"references-count":12,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2012.2217111","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,8]]}}}