{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:15:09Z","timestamp":1763468109981},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2012,12,1]],"date-time":"2012-12-01T00:00:00Z","timestamp":1354320000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test. Comput."],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1109\/mdt.2012.2226014","type":"journal-article","created":{"date-parts":[[2012,10,23]],"date-time":"2012-10-23T18:05:58Z","timestamp":1351015558000},"page":"27-39","source":"Crossref","is-referenced-by-count":22,"title":["Mixed-Signal SoCs With In Situ Self-Healing Circuitry"],"prefix":"10.1109","volume":"29","author":[{"given":"Christopher","family":"Maxey","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanjay","family":"Raman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kari","family":"Groves","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tony","family":"Quach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Len","family":"Orlando","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aji","family":"Mattamana","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gregory","family":"Creech","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jay","family":"Rockway","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2011.6082760"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.1956"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.43"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2012.6242268"},{"key":"ref14","article-title":"Virtual phase noise sensor for self-healing voltage controlled oscillators","author":"yaldiz","year":"0","journal-title":"Proc 2011 Government Microcircuit Applicat Critical Technol Cont"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2012.6243774"},{"key":"ref16","first-page":"184","article-title":"An 800 MS\/s dual-residue pipeline ADC in 40 nm CMOS","author":"mulder","year":"0","journal-title":"Proc 2011 IEEE Int Solid-State Circuits Cont"},{"key":"ref17","first-page":"49","article-title":"Tunable receiver for pp. 6–18 GHz with autonomous self-healing","author":"sollner","year":"0","journal-title":"Proc 2011 Government Microcircuit Applicat Critical Technol Cont"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2011.2178096"},{"key":"ref19","article-title":"A low overhead self-healing embedded system for ensuring high performance yield and long-term sustainability of a 60 GHz 4 Gbps radio-on-a-chip","author":"tang","year":"0","journal-title":"Proc 2012 IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1147\/rd.504.0433"},{"key":"ref3","article-title":"International Technology Roadmap for Semiconductors, 2011","year":"2011"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2019161"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373575"},{"key":"ref8","first-page":"311","article-title":"Design and analysis of pp. 1–60 GHz, RF CMOS peak detectors for LNA calibration","author":"jayaraman","year":"0","journal-title":"Proc 2009 Int Symp VLSI Design Automation and Test"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2093141"},{"key":"ref2","first-page":"247","article-title":"SiGe HBT technology with fmax\/fr= 350\/300 GHz and gate delay below 3.3 ps","author":"khater","year":"0","journal-title":"Proc IEEE Int Electron Device Meeting 2004"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703431"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2011.6082757"}],"container-title":["IEEE Design & Test of Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/54\/6459032\/06338370.pdf?arnumber=6338370","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:46:04Z","timestamp":1642005964000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6338370\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12]]},"references-count":19,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2012.2226014","relation":{},"ISSN":["0740-7475"],"issn-type":[{"value":"0740-7475","type":"print"}],"subject":[],"published":{"date-parts":[[2012,12]]}}}