{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,8]],"date-time":"2025-10-08T15:34:26Z","timestamp":1759937666990},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Des. Test"],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/mdt.2013.2247457","type":"journal-article","created":{"date-parts":[[2013,2,14]],"date-time":"2013-02-14T19:04:59Z","timestamp":1360868699000},"page":"55-62","source":"Crossref","is-referenced-by-count":12,"title":["Eliminating Timing Information Flows in a Mix-Trusted System-on-Chip"],"prefix":"10.1109","volume":"30","author":[{"given":"Jason","family":"Oberg","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timothy","family":"Sherwood","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryan","family":"Kastner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1508244.1508258"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"ref10","year":"0","journal-title":"WishBone Specification"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2004.26"},{"key":"ref11","year":"2010","journal-title":"128-Bit Verilog AES Core"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1024393.1024404"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1186736.1186737"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000087"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.265"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.34"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024782"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2008.31"}],"container-title":["IEEE Design & Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6221038\/6523949\/06461920.pdf?arnumber=6461920","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:46:05Z","timestamp":1642005965000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6461920\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":12,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mdt.2013.2247457","relation":{},"ISSN":["2168-2356","2168-2364"],"issn-type":[{"value":"2168-2356","type":"print"},{"value":"2168-2364","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,4]]}}}