{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T22:02:44Z","timestamp":1729634564155,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/meco.2017.7977167","type":"proceedings-article","created":{"date-parts":[[2017,7,25]],"date-time":"2017-07-25T19:28:31Z","timestamp":1501010911000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["High-level test data generation for software-based self-test in microprocessors"],"prefix":"10.1109","author":[{"given":"Adeboye Stephen","family":"Oyeniran","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Artjom","family":"Jasnetski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anton","family":"Tsertov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.186"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/54.485782"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3176\/eng.2010.1.06"},{"key":"ref13","article-title":"Software-based selftest generation for microprocessors with high-level decision diagrams","author":"ubar","year":"2014","journal-title":"Proc of LATW"},{"key":"ref14","article-title":"New Fault Models and Self-Test Generation for Microprocessors using HLDDs","author":"jasnetski","year":"2015","journal-title":"In Proc of DDECS"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2015.7396738"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2016.7482445"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676471"},{"journal-title":"Self-Testing and Self-Repairing Embedded Processors Techniques for Statically Scheduled Superscalar Architectures","year":"2015","author":"sch\u00f6lzel","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219068"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639687"},{"key":"ref6","article-title":"Automated mapping of precomputed module-level test sequences to processor instructions","author":"gurumurthy","year":"2005","journal-title":"ITC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.15"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2208130"},{"key":"ref2","article-title":"Software-based self-testing methodology for processor cores","volume":"20","author":"chen","year":"2001","journal-title":"IEEE Trans on CAD of IC and Systems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"516","DOI":"10.1109\/TVLSI.2009.2036184","article-title":"Effective hybrid test program development for software-based self-testing of pipeline processor cores","volume":"19","author":"tai-hua lu","year":"2011","journal-title":"IEEE Trans on VLSI Systems"},{"journal-title":"The SPARC Architecture Manual","year":"0","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/EWME.2014.6877400"},{"year":"0","key":"ref21"},{"year":"0","key":"ref23"}],"event":{"name":"2017 6th Mediterranean Conference on Embedded Computing (MECO)","start":{"date-parts":[[2017,6,11]]},"location":"Bar, Montenegro","end":{"date-parts":[[2017,6,15]]}},"container-title":["2017 6th Mediterranean Conference on Embedded Computing (MECO)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7970251\/7977112\/07977167.pdf?arnumber=7977167","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T15:49:17Z","timestamp":1569944957000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7977167\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/meco.2017.7977167","relation":{},"subject":[],"published":{"date-parts":[[2017,6]]}}}