{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:19:25Z","timestamp":1729660765317,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/med.2017.7984303","type":"proceedings-article","created":{"date-parts":[[2017,7,25]],"date-time":"2017-07-25T17:36:51Z","timestamp":1501004211000},"page":"1332-1338","source":"Crossref","is-referenced-by-count":7,"title":["Product quality prediction using alarm data : Application to the semiconductor manufacturing process"],"prefix":"10.1109","author":[{"given":"Mariam","family":"Melhem","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bouchra","family":"Ananou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mustapha","family":"Ouladsine","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michel","family":"Combal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacques","family":"Pinaton","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TSM.2006.873514"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.compchemeng.2012.06.042"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.ifacol.2015.09.040"},{"key":"ref13","first-page":"443","article-title":"A new approach to process alarm reduction using statistical point processes","author":"nishiguchi","year":"2005","journal-title":"SICE Annual Conference"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.3182\/20100831-4-FR-2021.00033"},{"year":"2013","author":"cheng","journal-title":"Data-driven Techniques on Alarm System Analysis and Improvement","key":"ref15"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1252\/kakoronbunshu.39.352"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/S1570-7946(09)70644-3"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.compchemeng.2010.07.029"},{"key":"ref19","first-page":"43","article-title":"A survey of binary similarity and distance measures","volume":"8","author":"choi","year":"2010","journal-title":"Journal of Systemics Cybernetics and Informatics"},{"key":"ref4","article-title":"Management of Alarm Systems for the Process Industries","volume":"18","year":"2009","journal-title":"ANSI Standard"},{"year":"2009","author":"rothenberg","journal-title":"Alarm Management for Process Control","key":"ref3"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TPS.2003.820681"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.procir.2013.05.033"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.eswa.2009.11.087"},{"key":"ref7","first-page":"372","article-title":"Fault detection, diagnosis, and optimization of wafer manufacturing processes utilizing knowledge creation","volume":"4","author":"bae","year":"2006","journal-title":"International Journal of Control Automation and Systems"},{"key":"ref2","article-title":"Alarm Management: A Comprehensive Guide: Practical and Proven Methods to Optimize the Performance of Alarm Management Systems","author":"hollifield","year":"2010","journal-title":"ISA"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/CASE.2011.6042426"},{"year":"2007","journal-title":"Alarm Systems A Guide to Design","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/ACC.2010.5530508"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1016\/j.jprocont.2007.11.007"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.isatra.2012.03.005"},{"key":"ref24","volume":"14","author":"tikhonov","year":"1977","journal-title":"Solutions of Ill-posed Problems"},{"key":"ref23","article-title":"Developing MATLAB Tools for Data Based Alarm Management and Causality Analysis","author":"amin","year":"2012","journal-title":"University of Alberta"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"407","DOI":"10.1214\/009053604000000067","article-title":"Least angle regression","volume":"32","author":"efron","year":"2004","journal-title":"The Annals of Statistics"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.2307\/1267351"}],"event":{"name":"2017 25th Mediterranean Conference on Control and Automation (MED)","start":{"date-parts":[[2017,7,3]]},"location":"Valletta, Malta","end":{"date-parts":[[2017,7,6]]}},"container-title":["2017 25th Mediterranean Conference on Control and Automation (MED)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7974655\/7984082\/07984303.pdf?arnumber=7984303","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T12:05:44Z","timestamp":1569931544000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7984303\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/med.2017.7984303","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}