{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T13:05:18Z","timestamp":1742389518501},"reference-count":19,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/metric.2002.1011331","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T20:42:54Z","timestamp":1056573774000},"page":"118-127","source":"Crossref","is-referenced-by-count":13,"title":["Software inspection benchmarking-a qualitative and quantitative comparative opportunity"],"prefix":"10.1109","author":[{"given":"C.","family":"Wohlin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Aurum","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Petersson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Shull","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Ciolkowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-540-45051-1_9","article-title":"Applying Benchmarking to Learn from Best Practices","author":"beitz","year":"2000","journal-title":"Proceedings 2nd International Conference on Product Focused Software Process Improvement"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/52.820015"},{"key":"ref12","first-page":"340","article-title":"Using Simulation to Build Inspection Efficiency Benchmarks for Development Process","author":"briand","year":"0","journal-title":"Proc 1998 Int'l Conf on Software Engineering"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1998.671393"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0950-5849(98)00101-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.1999.809736"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.1999.809735"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-4625-2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/BF00368702"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009848320066"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/32.825763"},{"journal-title":"Software Inspection","year":"1993","author":"gilb","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1108\/14635779810245134"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1108\/14635779810234802"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1108\/14635770010322324"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/47.387771"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/52.28121"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1986.6312976"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/2.467614"}],"event":{"name":"Eighth IEEE Symposium on Software Metrics","acronym":"METRIC-02","location":"Ottawa, Ont., Canada"},"container-title":["Proceedings Eighth IEEE Symposium on Software Metrics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7904\/21796\/01011331.pdf?arnumber=1011331","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:40:57Z","timestamp":1497566457000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1011331\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/metric.2002.1011331","relation":{},"subject":[]}}