{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T16:57:08Z","timestamp":1768409828453,"version":"3.49.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2002]]},"DOI":"10.1109\/metric.2002.1011343","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T20:42:54Z","timestamp":1056573774000},"page":"249-258","source":"Crossref","is-referenced-by-count":127,"title":["What we have learned about fighting defects"],"prefix":"10.1109","author":[{"given":"F.","family":"Shull","sequence":"first","affiliation":[{"name":"Fraunhofer Center for Exp. Software Eng., MA, USA"}]},{"given":"V.","family":"Basili","sequence":"additional","affiliation":[{"name":"Fraunhofer Center for Exp. Software Eng., MA, USA"}]},{"given":"B.","family":"Boehm","sequence":"additional","affiliation":[]},{"given":"A.W.","family":"Brown","sequence":"additional","affiliation":[]},{"given":"P.","family":"Costa","sequence":"additional","affiliation":[]},{"given":"M.","family":"Lindvall","sequence":"additional","affiliation":[]},{"given":"D.","family":"Port","sequence":"additional","affiliation":[]},{"given":"I.","family":"Rus","sequence":"additional","affiliation":[]},{"given":"R.","family":"Tesoriero","sequence":"additional","affiliation":[]},{"given":"M.","family":"Zelkowitz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"167","article-title":"Software Development at a Baldrige Winner","author":"lindner","year":"1994","journal-title":"Proc ELECTRO 94"},{"key":"ref11","year":"1996","journal-title":"McGibbon T Software Reliability Data Summary DACS"},{"key":"ref12","article-title":"Performing Best In Class Software Inspections","author":"olson","year":"2001","journal-title":"Proc of SEPG"},{"key":"ref13","author":"royce","year":"1998","journal-title":"Software Project Management A Unified Framework"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/0471028959.sof273"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0950-5849(00)00130-0"},{"key":"ref3","author":"boehm","year":"2000","journal-title":"Software Cost Estimation with COCOMOII"},{"key":"ref6","article-title":"The Effects of Process Maturity on Software Development Effort","author":"clark","year":"1997"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/32.177364"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1142\/9789812389718_0017"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2001.931736"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"110","DOI":"10.1007\/3-540-44813-6_13","article-title":"Building an Experience Base for Software Engineering: A report on the first CeBASE eWorkshop","author":"basili","year":"2001","journal-title":"Proceedings of PROFES (Product Focused Software Process Improvement)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/52.300090"},{"key":"ref9","author":"jones","year":"1996","journal-title":"Applied Software Measurement"}],"event":{"name":"Proceedings Eighth IEEE Symposium on Software Metrics","location":"Ottawa, ON, Canada","start":{"date-parts":[[2002,6,4]]},"end":{"date-parts":[[2002,6,7]]}},"container-title":["Proceedings Eighth IEEE Symposium on Software Metrics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7904\/21796\/01011343.pdf?arnumber=1011343","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,9]],"date-time":"2021-06-09T10:48:05Z","timestamp":1623235685000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1011343\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/metric.2002.1011343","relation":{},"subject":[],"published":{"date-parts":[[2002]]}}}