{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,15]],"date-time":"2024-09-15T09:52:15Z","timestamp":1726393935565},"reference-count":16,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/metric.2003.1232459","type":"proceedings-article","created":{"date-parts":[[2004,3,1]],"date-time":"2004-03-01T21:26:50Z","timestamp":1078176410000},"page":"98-110","source":"Crossref","is-referenced-by-count":13,"title":["When can we test less?"],"prefix":"10.1109","author":[{"given":"T.","family":"Menzies","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.D.","family":"Stefano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Ammar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"McGill","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Callis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Davis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Chapman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1142\/9789812389701_0016"},{"key":"ref11","article-title":"Metrics that matter","author":"menzies","year":"2002","journal-title":"21th NASA SEL workshop on Software Engineering"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2001.919112"},{"key":"ref13","first-page":"445","article-title":"The case against accuracy estimation for comparing induction algorithms","author":"provost","year":"1998","journal-title":"Proc 15th International Conf on Machine Learning"},{"key":"ref14","first-page":"343","article-title":"Learning with Continuous Classes","author":"quinlan","year":"1992","journal-title":"5th Australian Joint Conference on Artificial Intel-ligence"},{"journal-title":"Software Verification and Validation for Practitioners and Managers Second Edition","year":"2001","author":"rakitin","key":"ref15"},{"journal-title":"Data Mining Practical Machine Learning Tools and Techniques with Java Im-plementations","year":"1999","author":"witten","key":"ref16"},{"journal-title":"Software Metrics A Rigorous and Practical Approach second edition","year":"1995","author":"fenton","key":"ref4"},{"key":"ref3","article-title":"The relationship of cyclomatic complexity, essential complexity and error rates","author":"chapman","year":"2002","journal-title":"Proceedings of the NASA Software Assurance Symposium Coolfont Resort and Conference Center in Berkley Springs West Virginia"},{"journal-title":"Signal Detection Theory","year":"1998","author":"heeger","key":"ref6"},{"journal-title":"Elements of Software Science","year":"1977","author":"halstead","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.1998.732690"},{"key":"ref2","article-title":"Classification and regression trees","author":"breiman","year":"1984","journal-title":"Technical report Wadsworth International Monterey CA"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0010-4809(89)90026-8"},{"journal-title":"Criticality analysis and risk assessment (cara) presentation by A verstar Inc","year":"1998","author":"mccaugherty","key":"ref9"}],"event":{"name":"Ninth International Software Metrics Symposium","acronym":"METRIC-03","location":"Sydney, NSW, Australia"},"container-title":["Proceedings. 5th International Workshop on Enterprise Networking and Computing in Healthcare Industry (IEEE Cat. No.03EX717)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8723\/27613\/01232459.pdf?arnumber=1232459","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T14:41:01Z","timestamp":1489416061000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1232459\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/metric.2003.1232459","relation":{},"subject":[]}}