{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T12:21:38Z","timestamp":1762431698848,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/metroi4.2019.8792889","type":"proceedings-article","created":{"date-parts":[[2019,8,13]],"date-time":"2019-08-13T01:24:08Z","timestamp":1565659448000},"page":"84-88","source":"Crossref","is-referenced-by-count":7,"title":["Line Balancing Assessment Enhanced by IoT and Simulation Tools"],"prefix":"10.1109","author":[{"given":"Marcello","family":"Fera","sequence":"first","affiliation":[]},{"given":"Alessandro","family":"Greco","sequence":"additional","affiliation":[]},{"given":"Mario","family":"Caterino","sequence":"additional","affiliation":[]},{"given":"Salvatore","family":"Gerbino","sequence":"additional","affiliation":[]},{"given":"Francesco","family":"Caputo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-96068-5_19"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-96098-2_88"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-94619-1_23"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ergon.2018.10.004"},{"journal-title":"Discrete-Event System Simulation","year":"2019","author":"banks","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.45.6.771"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-5273(97)00055-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2004.1371451"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s12008-013-0193-0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2008.03.013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2010.05.010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-1221-1"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1016\/j.artmed.2012.09.003","article-title":"Smart wearable systems: Current status and future challenges","volume":"56","author":"chan","year":"2012","journal-title":"Artificial Intelligence in Medicine"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3233\/RFT-170166"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.5267\/j.ijiec.2018.1.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2017.07.018"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2216537"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jii.2017.04.005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-73888-8_70"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-5273(98)00198-4"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s00779-006-0070-y"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2370945"}],"event":{"name":"2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT)","start":{"date-parts":[[2019,6,4]]},"location":"Naples, Italy","end":{"date-parts":[[2019,6,6]]}},"container-title":["2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&amp;IoT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8782660\/8792828\/08792889.pdf?arnumber=8792889","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:09:16Z","timestamp":1657854556000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8792889\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/metroi4.2019.8792889","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}