{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T13:18:48Z","timestamp":1770988728578,"version":"3.50.1"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/metroind4.0iot48571.2020.9138205","type":"proceedings-article","created":{"date-parts":[[2020,7,10]],"date-time":"2020-07-10T20:47:25Z","timestamp":1594414045000},"page":"407-412","source":"Crossref","is-referenced-by-count":7,"title":["Quality Assurance of Weld Seams Using Laser Triangulation Imaging and Deep Neural Networks"],"prefix":"10.1109","author":[{"given":"Andreas","family":"Spruck","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jurgen","family":"Seiler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Roll","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Dudziak","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jurgen","family":"Eckstein","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andre","family":"Kaup","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/app8112195"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"key":"ref12","first-page":"547","article-title":"A comparative study of different cnn models in city detection using landmark images","author":"junayed","year":"2018","journal-title":"Proc of the International Conference on Recent Trends in Image Processing and Pattern Recognition"},{"key":"ref13","first-page":"1097","article-title":"Imagenet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Advances in neural information processing systems"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-0461-4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0007-8506(07)61707-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/METROI4.2019.8792858"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-017-0098-0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(03)00081-1"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"259","DOI":"10.1016\/j.procir.2017.03.224","article-title":"New concepts for quality assurance of lightweight material","volume":"66","author":"zai\u00df","year":"2017","journal-title":"Procedia CIRP"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/METROI4.2019.8792911"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/METROI4.2018.8428332"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-006-0009-6"}],"event":{"name":"2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","location":"Roma, Italy","start":{"date-parts":[[2020,6,3]]},"end":{"date-parts":[[2020,6,5]]}},"container-title":["2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9130790\/9138168\/09138205.pdf?arnumber=9138205","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:57:04Z","timestamp":1656453424000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9138205\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/metroind4.0iot48571.2020.9138205","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}