{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:01:22Z","timestamp":1740099682572,"version":"3.37.3"},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/metroind4.0iot48571.2020.9138296","type":"proceedings-article","created":{"date-parts":[[2020,7,10]],"date-time":"2020-07-10T20:47:25Z","timestamp":1594414045000},"page":"665-668","source":"Crossref","is-referenced-by-count":5,"title":["In-Line Quality Control in Semiconductors Production and Availability for Industry 4.0"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6135-8386","authenticated-orcid":false,"given":"Enrico","family":"Petritoli","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8152-2112","authenticated-orcid":false,"given":"Fabio","family":"Leccese","sequence":"additional","affiliation":[]},{"given":"Giuseppe Schirripa","family":"Spagnolo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"The Revitalization of MIL-HDBK-217","author":"gullo","year":"0","journal-title":"IEEE Reliability Society 2008 Annual Technology Report"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/MetroAeroSpace.2016.7573199"},{"key":"ref12","first-page":"16","article-title":"New Reliability Prediction Methodology Aimed at Space Applications","year":"0","journal-title":"Appendix 1 to AO\/1-8811116\/NL\/PS"},{"year":"0","journal-title":"MIL-217 Bellcore\/Telcordia & Other Reliability Prediction Methods for Electronic Products","key":"ref13"},{"year":"0","journal-title":"Reliability Growth Enhancing Defense System Reliability","article-title":"Committee on National Statistics","key":"ref14"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/24.740547"},{"key":"ref16","first-page":"1155","article-title":"A Review of Reliability Prediction Methods for Electronic Devices, 2 Microelectron","volume":"42","author":"foucher","year":"2002","journal-title":"Wearout"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1108\/EUM0000000006104"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/MetroAeroSpace.2014.6865950"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/S0026-2714(02)00132-4"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1088\/0026-1394\/53\/2\/S65"},{"key":"ref4","first-page":"305","author":"arlow","year":"2005","journal-title":"UML 2 0 and the Unified Process Practical Object-Oriented Analysis and Design"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/MetroAeroSpace.2015.7180625"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/MetroAeroSpace.2017.7999581"},{"key":"ref6","first-page":"1644","article-title":"Android\/OSGi-based vehicular network management system","author":"teng-wen","year":"2010","journal-title":"Proc 12th International Conference on Advanced Communication Technology (ICACT)"},{"key":"ref29","first-page":"371","article-title":"Instantaneous availability and interval availability for systems with time-varying failure rate: stair-step approximation","author":"sun","year":"2001","journal-title":"Proceedings 2001 Pacific Rim International Symposium on Dependable Computing"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/MetroAeroSpace.2014.6865915"},{"year":"1991","journal-title":"Tech Rep MIL-HDBK-217F\/2","article-title":"Reliability Prediction of Electronic Equipment","key":"ref8"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/MetroAeroSpace.2014.6865924"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.21014\/actaimeko.v8i2.614"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.3390\/s18093171"},{"year":"0","author":"rubmann","journal-title":"Industry 4 0 The Future of Productivity and Growth in Manufacturing Industries BCG Online Article April 2015","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/MetroAeroSpace.2016.7573203"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/5.293157"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/MetroAeroSpace.2015.7180623"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/RAMS.2009.4914702"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/MetroAeroSpace.2015.7180624"},{"key":"ref26","first-page":"127","article-title":"A high accuracy navigation system for a tailless underwater glider","author":"petritoli","year":"0","journal-title":"IMEKO TC19 Workshop on Metrology for the Sea MetroSea 2017 Learning to Measure Sea Health Parameters"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TPEL.2012.2192503"}],"event":{"name":"2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","start":{"date-parts":[[2020,6,3]]},"location":"Roma, Italy","end":{"date-parts":[[2020,6,5]]}},"container-title":["2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9130790\/9138168\/09138296.pdf?arnumber=9138296","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:52:22Z","timestamp":1656453142000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9138296\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/metroind4.0iot48571.2020.9138296","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}