{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T11:01:14Z","timestamp":1725793274663},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/metroind4.0iot48571.2020.9138313","type":"proceedings-article","created":{"date-parts":[[2020,7,10]],"date-time":"2020-07-10T20:47:25Z","timestamp":1594414045000},"page":"642-647","source":"Crossref","is-referenced-by-count":6,"title":["Evaluation of the bounding box uncertainty of deep-learning object detection in HALCON software"],"prefix":"10.1109","author":[{"given":"Daniele","family":"Marchisotti","sequence":"first","affiliation":[]},{"given":"Vittorio","family":"Sala","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/6979.892151"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1162\/neco_a_00990"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1117\/12.2530899"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00346"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1515\/teme-2019-0076"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.5194\/isprs-archives-XLII-1-401-2018"}],"event":{"name":"2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)","start":{"date-parts":[[2020,6,3]]},"location":"Roma, Italy","end":{"date-parts":[[2020,6,5]]}},"container-title":["2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9130790\/9138168\/09138313.pdf?arnumber=9138313","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:50:45Z","timestamp":1656453045000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9138313\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/metroind4.0iot48571.2020.9138313","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}