{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:12:53Z","timestamp":1775002373845,"version":"3.50.1"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,26]],"date-time":"2022-10-26T00:00:00Z","timestamp":1666742400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,26]],"date-time":"2022-10-26T00:00:00Z","timestamp":1666742400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100006690","name":"Politecnico di Milano","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100006690","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,26]]},"DOI":"10.1109\/metroxraine54828.2022.9967583","type":"proceedings-article","created":{"date-parts":[[2022,12,5]],"date-time":"2022-12-05T23:43:02Z","timestamp":1670283782000},"page":"187-192","source":"Crossref","is-referenced-by-count":2,"title":["Experimental validation of an analog spiking neural network with STDP learning rule in CMOS technology"],"prefix":"10.1109","author":[{"given":"Elisabetta","family":"Polidori","sequence":"first","affiliation":[{"name":"Politecnico di Milano,DEIB,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giovanni","family":"Camisa","sequence":"additional","affiliation":[{"name":"Politecnico di Milano,DEIB,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alireza","family":"Mesri","sequence":"additional","affiliation":[{"name":"Politecnico di Milano,DEIB,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giorgio","family":"Ferrari","sequence":"additional","affiliation":[{"name":"Politecnico di Milano,Physics department,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cristina","family":"Polidori","sequence":"additional","affiliation":[{"name":"Politecnico di Milano,DEIB,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michele","family":"Mastella","sequence":"additional","affiliation":[{"name":"Zernike Institute for Advanced Materials and CogniGron University of Groningen,Groningen,The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enrico","family":"Prati","sequence":"additional","affiliation":[{"name":"Università degli studi di Milano and IFN-CNR,Physics Department,Milano,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","author":"hagenaars","year":"2021","journal-title":"Self-Supervised Learning of Event-Based Optical Flow with Spiking Neural Networks"},{"key":"ref11","first-page":"1","article-title":"An electronic neuromorphic system for real-time detection of High Frequency Oscillations (HFOs) in intracranial EEG","author":"sharifshazileh","year":"2020","journal-title":"Nat Commun"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuron.2018.08.033"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3304103"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2304638"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1126\/science.1254642"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2018.112130359"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2848203"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS48895.2020.9073965"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-017-17889-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/9781119507369"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1126\/science.aag2360"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2018.00774"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC53496.2022.9772783"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2022.851774"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2021.611300"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/BF00706595"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isci.2018.12.009"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA48506.2021.9560937"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7539102"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2310593"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/224081.224083"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409623"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/2632-959X\/abf2ae"}],"event":{"name":"2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)","location":"Rome, Italy","start":{"date-parts":[[2022,10,26]]},"end":{"date-parts":[[2022,10,28]]}},"container-title":["2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9967443\/9967445\/09967583.pdf?arnumber=9967583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T19:43:32Z","timestamp":1672083812000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9967583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,26]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/metroxraine54828.2022.9967583","relation":{},"subject":[],"published":{"date-parts":[[2022,10,26]]}}}