{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,25]],"date-time":"2026-01-25T04:34:26Z","timestamp":1769315666605,"version":"3.49.0"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T00:00:00Z","timestamp":1698192000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,25]],"date-time":"2023-10-25T00:00:00Z","timestamp":1698192000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,25]]},"DOI":"10.1109\/metroxraine58569.2023.10405749","type":"proceedings-article","created":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T18:26:36Z","timestamp":1706811996000},"page":"389-394","source":"Crossref","is-referenced-by-count":2,"title":["Cycle Aging Effect on Lithium-ion Battery Resistance: a Machine Learning Approach"],"prefix":"10.1109","author":[{"given":"Simone","family":"Barcellona","sequence":"first","affiliation":[{"name":"DEIB Politecnico di Milano,Milan,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Loris","family":"Cannelli","sequence":"additional","affiliation":[{"name":"IDSIA Dalle Molle Institute for Artificial Intelligence SUPSI-USI,Lugano,Switzerland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Silvia","family":"Colnago","sequence":"additional","affiliation":[{"name":"DEIB Politecnico di Milano,Milan,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Laurano","sequence":"additional","affiliation":[{"name":"DEIB Politecnico di Milano,Milan,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luigi","family":"Piegari","sequence":"additional","affiliation":[{"name":"DEIB Politecnico di Milano,Milan,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9783527836703.ch4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/s0378-7753(01)00783-2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/s0378-7753(02)00210-0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/vppc.2011.6042998"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/s0378-7753(02)00305-1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/979321"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/s0378-7753(03)00208-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2005.11.085"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1115\/1.4028698"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2012.05.095"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/en11051073"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/evs.2013.6914746"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2012.05.012"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2017.2756026"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2022.104658"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2021.111903"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/s42256-021-00312-3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/speedam.2016.7525915"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11101537"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2020.101310"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/en10122007"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.06.024"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/s0378-7753(01)00821-7"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/s0378-7753(03)00029-6"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tvt.2011.2127500"},{"key":"ref26","volume-title":"Neural Networks: A Comprehensive Foundation","author":"Haykin","year":"1998"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/nature16961"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3039858"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/bf00058655"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1031689014"}],"event":{"name":"2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)","location":"Milano, Italy","start":{"date-parts":[[2023,10,25]]},"end":{"date-parts":[[2023,10,27]]}},"container-title":["2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10405419\/10405547\/10405749.pdf?arnumber=10405749","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:47:00Z","timestamp":1706834820000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10405749\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,25]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/metroxraine58569.2023.10405749","relation":{},"subject":[],"published":{"date-parts":[[2023,10,25]]}}}