{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:14:31Z","timestamp":1740100471175,"version":"3.37.3"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T00:00:00Z","timestamp":1638144000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T00:00:00Z","timestamp":1638144000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T00:00:00Z","timestamp":1638144000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung Electronics Co., Ltd","doi-asserted-by":"publisher","award":["IO-210202-08366-01"],"award-info":[{"award-number":["IO-210202-08366-01"]}],"id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,11,29]]},"DOI":"10.1109\/milcom52596.2021.9653090","type":"proceedings-article","created":{"date-parts":[[2021,12,30]],"date-time":"2021-12-30T21:06:10Z","timestamp":1640898370000},"page":"629-634","source":"Crossref","is-referenced-by-count":0,"title":["Ray-tracing based Channel Modeling for Rough-boundary Environments"],"prefix":"10.1109","author":[{"given":"Kyoung-Min","family":"Park","sequence":"first","affiliation":[]},{"given":"Eunji","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Jinwook","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Jaehoon","family":"Jung","sequence":"additional","affiliation":[]},{"given":"Seong-Cheol","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/WECONF.2019.8840592"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2007.910462"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2018.2860991"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2018.2885451"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2018.2797531"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/e22101166"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2940247"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2018.2793872"},{"journal-title":"Microwave Engineering","year":"2011","author":"pozar","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3073324"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICMCIS.2018.8398723"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MILCOM.2009.5379781"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.1983.1071946"}],"event":{"name":"MILCOM 2021 - 2021 IEEE Military Communications Conference (MILCOM)","start":{"date-parts":[[2021,11,29]]},"location":"San Diego, CA, USA","end":{"date-parts":[[2021,12,2]]}},"container-title":["MILCOM 2021 - 2021 IEEE Military Communications Conference (MILCOM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9652874\/9652880\/09653090.pdf?arnumber=9653090","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T17:00:02Z","timestamp":1652202002000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9653090\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,11,29]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/milcom52596.2021.9653090","relation":{},"subject":[],"published":{"date-parts":[[2021,11,29]]}}}