{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T05:39:02Z","timestamp":1759815542110},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2012,10,1]],"date-time":"2012-10-01T00:00:00Z","timestamp":1349049600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/mim.2012.6314512","type":"journal-article","created":{"date-parts":[[2012,9,30]],"date-time":"2012-09-30T17:01:16Z","timestamp":1349024476000},"page":"28-34","source":"Crossref","is-referenced-by-count":9,"title":["Thermal performance of CMOS-SOI transistors from weak to strong inversion"],"prefix":"10.1109","volume":"15","author":[{"given":"Maria","family":"Malits","sequence":"first","affiliation":[]},{"given":"Dan","family":"Corcos","sequence":"additional","affiliation":[]},{"given":"Alexander","family":"Svetlitza","sequence":"additional","affiliation":[]},{"given":"Danny","family":"Elad","sequence":"additional","affiliation":[]},{"given":"Yael","family":"Nemirovsky","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","year":"0","journal-title":"IBM Semiconductor 0 18 Micron 7RF SOI CMOS Process"},{"key":"ref3","article-title":"The Tera-MOS sensor for monolithic passive THz imagers","author":"corcos","year":"0","journal-title":"IEEE COMCAS 2011 in Proc International IEEE Conference on Microwaves Communications Antennas and Electronic Systems"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.859664"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2007.02.029"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.259622"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2055829"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2006.01.008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026523"},{"key":"ref9","author":"sze","year":"2007","journal-title":"Physics of Semiconductor Devices"},{"key":"ref1","author":"gamiz","year":"0","journal-title":"Proc EUROSOI"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5289\/6314495\/06314512.pdf?arnumber=6314512","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:32Z","timestamp":1696518692000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6314512\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":10,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/mim.2012.6314512","relation":{},"ISSN":["1094-6969"],"issn-type":[{"value":"1094-6969","type":"print"}],"subject":[],"published":{"date-parts":[[2012,10]]}}}