{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T06:13:42Z","timestamp":1696572822788},"reference-count":1,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2014,8,1]],"date-time":"2014-08-01T00:00:00Z","timestamp":1406851200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2014,8]]},"DOI":"10.1109\/mim.2014.6873727","type":"journal-article","created":{"date-parts":[[2014,8,19]],"date-time":"2014-08-19T21:59:04Z","timestamp":1408485544000},"page":"22-26","source":"Crossref","is-referenced-by-count":0,"title":["LXI in satellite system testing"],"prefix":"10.1109","volume":"17","author":[{"given":"Jochen","family":"Wolle","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2013.6645059"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/6873712\/06873727.pdf?arnumber=6873727","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:35Z","timestamp":1696518695000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6873727"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,8]]},"references-count":1,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mim.2014.6873727","relation":{},"ISSN":["1094-6969"],"issn-type":[{"value":"1094-6969","type":"print"}],"subject":[],"published":{"date-parts":[[2014,8]]}}}