{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T08:41:33Z","timestamp":1696581693244},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2017,8,1]],"date-time":"2017-08-01T00:00:00Z","timestamp":1501545600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/mim.2017.8006390","type":"journal-article","created":{"date-parts":[[2017,8,29]],"date-time":"2017-08-29T18:43:50Z","timestamp":1504032230000},"page":"23-30","source":"Crossref","is-referenced-by-count":1,"title":["Run-time reconfigurable instruments for advanced board-level testing"],"prefix":"10.1109","volume":"20","author":[{"given":"Igor","family":"Aleksejev","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Artur","family":"Jutman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergei","family":"Devadze","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","year":"2012","journal-title":"How to Test High-speed Memory with Nonintrusive Embedded Instruments Whitepaper"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651917"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2015.7102411"},{"key":"ref13","year":"2013","journal-title":"Overcome Design Challenges with an Innovative IP Scalability Integration and Delivery Model"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2016.7589627"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401571"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537429"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584043"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401572"},{"key":"ref8","article-title":"ISA configurability of an FPGA test-processor used","author":"meza escobar","year":"0","journal-title":"Proc Latin American Test Workshop"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2012.6261241"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2010.5681496"},{"key":"ref1","article-title":"Its Importance and Adoption in the Test & Measurement Marketplace, Whitepaper","year":"2010","journal-title":"Embedded Instrumentation"},{"key":"ref9","year":"2003","journal-title":"Infrastructure IP for Programming and Test of in-system Memory Devices"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/8006379\/08006390.pdf?arnumber=8006390","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:40Z","timestamp":1696518700000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8006390\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":14,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mim.2017.8006390","relation":{},"ISSN":["1094-6969"],"issn-type":[{"value":"1094-6969","type":"print"}],"subject":[],"published":{"date-parts":[[2017,8]]}}}