{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,12]],"date-time":"2025-11-12T14:01:42Z","timestamp":1762956102693},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/mim.2019.8674638","type":"journal-article","created":{"date-parts":[[2019,3,26]],"date-time":"2019-03-26T23:30:19Z","timestamp":1553643019000},"page":"62-66","source":"Crossref","is-referenced-by-count":3,"title":["Measurement comparisons: A tool to guarantee the reliability of measurement systems and of high-tech industry"],"prefix":"10.1109","volume":"22","author":[{"given":"Flavio","family":"Galliana","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"26","article-title":"Final report on supplementary comparison EURAMET. EM-S32: Comparison of resistance standards at 1 T? and 100 T?","volume":"50","author":"jeckelmann","year":"2013","journal-title":"Metrologia"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/39\/6\/10"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2017.02.052"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2009.07.014"},{"key":"ref5","article-title":"Conformity assessment: general requirements for proficiency testing","year":"2010","journal-title":"International Organization for Standardization"},{"key":"ref8","first-page":"615","article-title":"The strategic role of interlaboratory comparison among international institutions to assure confidence: report of the INRIM and the European Spatial Agency Comparison on electrical quantities","volume":"3","author":"galliana","year":"2018","journal-title":"MAPAN"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.03.003"},{"key":"ref2","article-title":"Evaluation of measurement data-Guide to the expression of uncertainty in measurement","year":"2008","journal-title":"previously BIPM IEC IFCC ISO IUPAC IUPAP OIML Guide to the expression of uncertainty in measurement"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s12647-018-0266-4"},{"key":"ref1","year":"2012","journal-title":"International Vocabulary of Metrology-Basic and General Concepts and Associated Terms (VIM)"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/8674619\/08674638.pdf?arnumber=8674638","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:43Z","timestamp":1696518703000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8674638\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":10,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/mim.2019.8674638","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,4]]}}}