{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T09:49:54Z","timestamp":1696585794405},"reference-count":6,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T00:00:00Z","timestamp":1564617600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T00:00:00Z","timestamp":1564617600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T00:00:00Z","timestamp":1564617600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2019,8]]},"DOI":"10.1109\/mim.2019.8782194","type":"journal-article","created":{"date-parts":[[2019,7,30]],"date-time":"2019-07-30T20:21:33Z","timestamp":1564518093000},"page":"22-28","source":"Crossref","is-referenced-by-count":0,"title":["Test challenges of multi-gigabit serial buses"],"prefix":"10.1109","volume":"22","author":[{"given":"Michael","family":"Fluet","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pavel","family":"Gilenberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","author":"hillerkuss","year":"2018","journal-title":"Tutorials of Fiber Optic Products"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2011.74"},{"key":"ref6","author":"ghiasi","year":"2018","journal-title":"PAM-8 Optical Simulations"},{"key":"ref5","article-title":"Using Eye Diagrams","author":"hillerkuss","year":"2018","journal-title":"Keysight Technologies"},{"key":"ref2","article-title":"How Do I Measure the Bit Error Rate (BER) to a Given Confidence Level on the J-BERT M8020A and the M8040A High-Performance BERT","author":"fluet","year":"2018","journal-title":"Keysight Technologies"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2018.8532513"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/8782185\/08782194.pdf?arnumber=8782194","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:44Z","timestamp":1696518704000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8782194\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,8]]},"references-count":6,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/mim.2019.8782194","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,8]]}}}