{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T09:49:40Z","timestamp":1696585780089},"reference-count":9,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Instrum. Meas. Mag."],"published-print":{"date-parts":[[2020,2]]},"DOI":"10.1109\/mim.2020.8979524","type":"journal-article","created":{"date-parts":[[2020,2,3]],"date-time":"2020-02-03T20:49:09Z","timestamp":1580762949000},"page":"50-55","source":"Crossref","is-referenced-by-count":0,"title":["Linear measurements from nonlinear sensors: Identifying distortion with incidental noise"],"prefix":"10.1109","volume":"23","author":[{"given":"Lachlan J.","family":"Gunn","sequence":"first","affiliation":[]},{"given":"Andrew","family":"Allison","sequence":"additional","affiliation":[]},{"given":"Derek","family":"Abbott","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","volume":"im 41","year":"0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/NORBERT.2016.7547454"},{"key":"ref6","year":"0","journal-title":"STM32F4DISCOVERY - Discovery kit with STM32F407VC MCU"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2001.929490"},{"key":"ref8","year":"0","journal-title":"Stochastic Instrumentation Tools"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1993.5.2.305"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2014.6986079"},{"key":"ref9","author":"niculescu","year":"2001","journal-title":"Delay Effects on Stability A Robust Control Approach"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/el.2013.2547"}],"container-title":["IEEE Instrumentation & Measurement Magazine"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5289\/8979508\/08979524.pdf?arnumber=8979524","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T15:11:45Z","timestamp":1696518705000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8979524\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,2]]},"references-count":9,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/mim.2020.8979524","relation":{},"ISSN":["1094-6969","1941-0123"],"issn-type":[{"value":"1094-6969","type":"print"},{"value":"1941-0123","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,2]]}}}